Study on trapping effects in AlGaN/GaN-on-Si devices with vertical interconnect structures
10.1149/2.0131711jss
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| Main Authors: | , , , , , |
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| 其他作者: | |
| 格式: | Editorial |
| 出版: |
Electrochemical Society
2020
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| 在線閱讀: | https://scholarbank.nus.edu.sg/handle/10635/183553 |
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