Study on trapping effects in AlGaN/GaN-on-Si devices with vertical interconnect structures

Study on trapping effects in AlGaN/GaN-on-Si devices with vertical interconnect structures

10.1149/2.0131711jss

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書目詳細資料
Main Authors:	Chang, T.-F, Chang, C.-Y, Huang, C.-F, Liang, Y.C, Samudra, G.S, Lin, R.-M
其他作者:	ELECTRICAL AND COMPUTER ENGINEERING
格式:	Editorial
出版:	Electrochemical Society 2020
在線閱讀:	https://scholarbank.nus.edu.sg/handle/10635/183553
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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