Quantitative material analysis using secondary electron energy spectromicroscopy
10.1038/s41598-020-78973-0
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2021
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sg-nus-scholar.10635-1992452024-04-04T02:33:21Z Quantitative material analysis using secondary electron energy spectromicroscopy Han, W. Zheng, M. Banerjee, A. Luo, Y.Z. Shen, L. Khursheed, Anjam DEPT OF ELECTRICAL & COMPUTER ENGG MECHANICAL ENGINEERING 10.1038/s41598-020-78973-0 Scientific Reports 10 1 22144 2021-08-25T09:14:33Z 2021-08-25T09:14:33Z 2020 Article Han, W., Zheng, M., Banerjee, A., Luo, Y.Z., Shen, L., Khursheed, Anjam (2020). Quantitative material analysis using secondary electron energy spectromicroscopy. Scientific Reports 10 (1) : 22144. ScholarBank@NUS Repository. https://doi.org/10.1038/s41598-020-78973-0 2045-2322 https://scholarbank.nus.edu.sg/handle/10635/199245 Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ Nature Research Scopus OA2020 |
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10.1038/s41598-020-78973-0 |
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DEPT OF ELECTRICAL & COMPUTER ENGG |
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DEPT OF ELECTRICAL & COMPUTER ENGG Han, W. Zheng, M. Banerjee, A. Luo, Y.Z. Shen, L. Khursheed, Anjam |
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Article |
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Han, W. Zheng, M. Banerjee, A. Luo, Y.Z. Shen, L. Khursheed, Anjam |
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Han, W. Zheng, M. Banerjee, A. Luo, Y.Z. Shen, L. Khursheed, Anjam Quantitative material analysis using secondary electron energy spectromicroscopy |
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Han, W. |
title |
Quantitative material analysis using secondary electron energy spectromicroscopy |
title_short |
Quantitative material analysis using secondary electron energy spectromicroscopy |
title_full |
Quantitative material analysis using secondary electron energy spectromicroscopy |
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Quantitative material analysis using secondary electron energy spectromicroscopy |
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Quantitative material analysis using secondary electron energy spectromicroscopy |
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quantitative material analysis using secondary electron energy spectromicroscopy |
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Nature Research |
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2021 |
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https://scholarbank.nus.edu.sg/handle/10635/199245 |
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