The Charge-Based Flicker Noise Model for HEMTs

IEEE Microwave and Wireless Components Letters

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Bibliographic Details
Main Authors: HAORUI LUO, XU YAN, WENRUI HU, YONGXIN GUO
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: IEEE 2021
Online Access:https://scholarbank.nus.edu.sg/handle/10635/202149
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Institution: National University of Singapore
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