The Charge-Based Flicker Noise Model for HEMTs
IEEE Microwave and Wireless Components Letters
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Main Authors: | HAORUI LUO, XU YAN, WENRUI HU, YONGXIN GUO |
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Other Authors: | ELECTRICAL AND COMPUTER ENGINEERING |
Format: | Article |
Published: |
IEEE
2021
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/202149 |
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Institution: | National University of Singapore |
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