Significance of activation functions in developing an online classifier for semiconductor defect detection

Significance of activation functions in developing an online classifier for semiconductor defect detection

https://doi.org/10.1016/j.knosys.2022.108818

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Bibliographic Details
Main Authors: Md Meftahul Ferdaus, Bangjian Zhou, Ji Wei Yoon, Kain Lu Low, Jieming Pan, Joydeep Ghosh, Min Wu, Xiaoli Li, Aaron Voon-Yew Thean, J. Senthilnath
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Language:English
Published: Elsevier 2023
Subjects:
Leaky ReLU
Online learning
Defect detection
Prequential
Semiconductors
Online Access:https://scholarbank.nus.edu.sg/handle/10635/238262
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Institution: National University of Singapore
Language: English

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