Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability

by SIVAN MAHESWARI, LEONG JIN FENG, JOYDEEP GHOSH, TANG BAOSHAN, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON
Published 2022

Reconfigurable nonlinear photonic activation function for photonic neural network based on non-volatile opto-resistive RAM switch

by Zefeng Xu, Baoshan Tang, ZHANG XIANGYU, LEONG JIN FENG, Jieming Pan, Sonu Hooda, Evgeny Zamburg, Voon Yew Thean
Published 2022

Seal Integrity Testing Utilizing Non-Destructive Capacitive Sensing for Product Packaging Assurance

by JIEMING PAN, Li Yida, LUO YUXUAN, ZHANG XIANGYU, Zaifeng Yang, Wong Liang Tai,David, Niu Xuhua, Tham Chen Khong, THEAN VOON YEW, AARON
Published 2022

First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation Effect for BEOL-Compatibl...

by Chun-Kuei Chen, Zihang Fang, Sonu Hooda, Manohar Lal, Umesh Chand, Zefeng Xu, Jieming Pan, Shih-Hao Tsai, Evgeny Zamburg, Aaron Voon-Yew Thean
Published 2023

Hybrid-Flexible Bimodal Sensing Wearable Glove System for Complex Hand Gesture Recognition

by Jieming Pan, Yida Li, Yuxuan Luo, Xiangyu Zhang, Xinghua Wang, David Liang Tai Wong, Chun-Huat Heng, Chen-Khong Tham, Aaron Voon-Yew Thean
Published 2022

First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation Effect for BEOL-Compatibl...

by Chun-Kuei Chen, Zihang Fang, Sonu Hooda, Manohar Lal, Umesh Chand, Zefeng Xu, Jieming Pan, Shih-Hao Tsai, Evgeny Zamburg, Aaron Voon-Yew Thean
Published 2022

Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor

by Tsai Shih-Hao, Fang Zihang, WANG XINGHUA, UMESH CHAND, Chun-Kuei Chen, SONU DEVI, SIVAN MAHESWARI, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON
Published 2022

Significance of activation functions in developing an online classifier for semiconductor defect detection

by Md Meftahul Ferdaus, Bangjian Zhou, Ji Wei Yoon, Kain Lu Low, Jieming Pan, Joydeep Ghosh, Min Wu, Xiaoli Li, Aaron Voon-Yew Thean, J. Senthilnath
Published 2023

Non-destructive online seal integrity inspection utilizing autoencoder-based electrical capacitance tomography for product packaging assurance

by JIEMING PAN, Zaifeng Yang, THEAN VOON YEW, AARON, STEPHANIE HUI KIT YAP, ZHANG XIANGYU, Li Yida, LUO YUXUAN, Evgeny Zamburg, Tham Chen Khong, En-Xiao Liu, Zefeng Xu
Published 2022

Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistors

by JIEMING PAN, LOW KAIN LU, JOYDEEP GHOSH, Senthilnath Jayavelu, Md Meftahul Ferdaus, Shang Yi Lim, Evgeny Zamburg, Li Yida, TANG BAOSHAN, WANG XINGHUA, LEONG JIN FENG, Savitha Ramasamy, Tonio Buonassisi, Tham Chen Khong, THEAN VOON YEW, AARON
Published 2022