Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices

Electronics Letters

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Bibliographic Details
Main Authors: Yeo, S.P., Cheng, M.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50566
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Institution: National University of Singapore
Description
Summary:Electronics Letters