Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices

Electronics Letters

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Main Authors: Yeo, S.P., Cheng, M.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/50566
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-505662024-11-13T18:13:13Z Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices Yeo, S.P. Cheng, M. ELECTRICAL ENGINEERING MECHANICAL & PRODUCTION ENGINEERING Microwave measurement Reflectometers Electronics Letters 32 6 565-566 ELLEA 2014-04-23T02:59:51Z 2014-04-23T02:59:51Z 1996-03-14 Article Yeo, S.P.,Cheng, M. (1996-03-14). Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices. Electronics Letters 32 (6) : 565-566. ScholarBank@NUS Repository. 00135194 http://scholarbank.nus.edu.sg/handle/10635/50566 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Microwave measurement
Reflectometers
spellingShingle Microwave measurement
Reflectometers
Yeo, S.P.
Cheng, M.
Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
description Electronics Letters
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Yeo, S.P.
Cheng, M.
format Article
author Yeo, S.P.
Cheng, M.
author_sort Yeo, S.P.
title Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
title_short Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
title_full Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
title_fullStr Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
title_full_unstemmed Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
title_sort improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/50566
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