Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID

International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings

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Main Authors: Cha, C.L., Vassiliev, V., Chor, E.F., See, A.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50567
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-505672015-01-17T03:47:21Z Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID Cha, C.L. Vassiliev, V. Chor, E.F. See, A.K. ELECTRICAL ENGINEERING PHYSICS International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings 38-41 00243 2014-04-23T02:59:53Z 2014-04-23T02:59:53Z 2000 Article Cha, C.L.,Vassiliev, V.,Chor, E.F.,See, A.K. (2000). Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID. International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings : 38-41. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/50567 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Cha, C.L.
Vassiliev, V.
Chor, E.F.
See, A.K.
format Article
author Cha, C.L.
Vassiliev, V.
Chor, E.F.
See, A.K.
spellingShingle Cha, C.L.
Vassiliev, V.
Chor, E.F.
See, A.K.
Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
author_sort Cha, C.L.
title Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
title_short Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
title_full Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
title_fullStr Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
title_full_unstemmed Improved PECVD pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive PID
title_sort improved pecvd pre-metal oxide liner deposition process with low residual charge non-uniformity in film to avoid excessive pid
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/50567
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