Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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書目詳細資料
Main Authors:	Yeo, S.P., Ang, C.K., Cheng, M.
其他作者:	ELECTRICAL ENGINEERING
格式:	Conference or Workshop Item
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/50628
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	National University of Singapore

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