A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation
Journal of Applied Physics
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2014
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sg-nus-scholar.10635-543972024-11-08T22:09:19Z A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation Cheng, Z.Y. Ling, C.H. ELECTRICAL ENGINEERING Journal of Applied Physics 83 10 5289-5294 JAPIA 2014-06-16T09:30:42Z 2014-06-16T09:30:42Z 1998-05-15 Article Cheng, Z.Y.,Ling, C.H. (1998-05-15). A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation. Journal of Applied Physics 83 (10) : 5289-5294. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/54397 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Journal of Applied Physics |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Cheng, Z.Y. Ling, C.H. |
| format |
Article |
| author |
Cheng, Z.Y. Ling, C.H. |
| spellingShingle |
Cheng, Z.Y. Ling, C.H. A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| author_sort |
Cheng, Z.Y. |
| title |
A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| title_short |
A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| title_full |
A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| title_fullStr |
A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| title_full_unstemmed |
A model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| title_sort |
model for minority carrier lifetime variation in the oxide-silicon structure following 253.7 nm ultraviolet irradiation |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/54397 |
| _version_ |
1821212739666706432 |