Analysis of high-power devices using proton beam induced charge microscopy
10.1016/S0026-2714(01)00159-7
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sg-nus-scholar.10635-550822023-08-23T07:33:14Z Analysis of high-power devices using proton beam induced charge microscopy Zmeck, M. Phang, J. Bettiol, A. Osipowicz, T. Watt, F. Balk, L. Niedernostheide, F.-J. Schulze, H.-J. Falck, E. Barthelmess, R. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1016/S0026-2714(01)00159-7 Microelectronics Reliability 41 9-10 1519-1524 MCRLA 2014-06-17T02:38:58Z 2014-06-17T02:38:58Z 2001-09 Article Zmeck, M., Phang, J., Bettiol, A., Osipowicz, T., Watt, F., Balk, L., Niedernostheide, F.-J., Schulze, H.-J., Falck, E., Barthelmess, R. (2001-09). Analysis of high-power devices using proton beam induced charge microscopy. Microelectronics Reliability 41 (9-10) : 1519-1524. ScholarBank@NUS Repository. https://doi.org/10.1016/S0026-2714(01)00159-7 00262714 http://scholarbank.nus.edu.sg/handle/10635/55082 000171384900042 Scopus |
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10.1016/S0026-2714(01)00159-7 |
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PHYSICS |
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PHYSICS Zmeck, M. Phang, J. Bettiol, A. Osipowicz, T. Watt, F. Balk, L. Niedernostheide, F.-J. Schulze, H.-J. Falck, E. Barthelmess, R. |
| format |
Article |
| author |
Zmeck, M. Phang, J. Bettiol, A. Osipowicz, T. Watt, F. Balk, L. Niedernostheide, F.-J. Schulze, H.-J. Falck, E. Barthelmess, R. |
| spellingShingle |
Zmeck, M. Phang, J. Bettiol, A. Osipowicz, T. Watt, F. Balk, L. Niedernostheide, F.-J. Schulze, H.-J. Falck, E. Barthelmess, R. Analysis of high-power devices using proton beam induced charge microscopy |
| author_sort |
Zmeck, M. |
| title |
Analysis of high-power devices using proton beam induced charge microscopy |
| title_short |
Analysis of high-power devices using proton beam induced charge microscopy |
| title_full |
Analysis of high-power devices using proton beam induced charge microscopy |
| title_fullStr |
Analysis of high-power devices using proton beam induced charge microscopy |
| title_full_unstemmed |
Analysis of high-power devices using proton beam induced charge microscopy |
| title_sort |
analysis of high-power devices using proton beam induced charge microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/55082 |
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1775627005995253760 |