Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations
10.1109/TED.2009.2016396
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2014
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sg-nus-scholar.10635-552872023-10-27T07:04:10Z Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations Zhao, H. Rustagi, S.C. Ma, F.-J. Samudra, G.S. Singh, N. Lo, G.Q. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING Charge-based capacitance measurement (CBCM) technique Nanoscale devices Nanowire MOSFETs Sub-femtofarad capacitance measurements Transient TCAD simulations 10.1109/TED.2009.2016396 IEEE Transactions on Electron Devices 56 5 1157-1160 IETDA 2014-06-17T02:41:21Z 2014-06-17T02:41:21Z 2009 Article Zhao, H., Rustagi, S.C., Ma, F.-J., Samudra, G.S., Singh, N., Lo, G.Q., Kwong, D.-L. (2009). Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations. IEEE Transactions on Electron Devices 56 (5) : 1157-1160. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2009.2016396 00189383 http://scholarbank.nus.edu.sg/handle/10635/55287 000265712400062 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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ScholarBank@NUS |
| topic |
Charge-based capacitance measurement (CBCM) technique Nanoscale devices Nanowire MOSFETs Sub-femtofarad capacitance measurements Transient TCAD simulations |
| spellingShingle |
Charge-based capacitance measurement (CBCM) technique Nanoscale devices Nanowire MOSFETs Sub-femtofarad capacitance measurements Transient TCAD simulations Zhao, H. Rustagi, S.C. Ma, F.-J. Samudra, G.S. Singh, N. Lo, G.Q. Kwong, D.-L. Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| description |
10.1109/TED.2009.2016396 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Zhao, H. Rustagi, S.C. Ma, F.-J. Samudra, G.S. Singh, N. Lo, G.Q. Kwong, D.-L. |
| format |
Article |
| author |
Zhao, H. Rustagi, S.C. Ma, F.-J. Samudra, G.S. Singh, N. Lo, G.Q. Kwong, D.-L. |
| author_sort |
Zhao, H. |
| title |
Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| title_short |
Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| title_full |
Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| title_fullStr |
Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| title_full_unstemmed |
Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations |
| title_sort |
charge-based capacitance measurement technique for nanoscale devices: accuracy assessment based on tcad simulations |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/55287 |
| _version_ |
1781412103953842176 |