Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations
10.1109/TED.2009.2016396
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Main Authors: | Zhao, H., Rustagi, S.C., Ma, F.-J., Samudra, G.S., Singh, N., Lo, G.Q., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55287 |
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Institution: | National University of Singapore |
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