$Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis$

Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis

Electronic Device Failure Analysis

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Bibliographic Details
Main Authors:	Goh, S.H., Quah, A.C.T., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55334
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-55334
record_format	dspace
spelling	sg-nus-scholar.10635-553342015-01-06T18:41:36Z Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis Goh, S.H. Quah, A.C.T. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Electronic Device Failure Analysis 12 3 20-27 2014-06-17T02:41:54Z 2014-06-17T02:41:54Z 2010 Article Goh, S.H.,Quah, A.C.T.,Ravikumar, V.K.,Phoa, S.L.,Narang, V.,Chin, J.M.,Chua, C.M.,Phang, J.C.H. (2010). Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis. Electronic Device Failure Analysis 12 (3) : 20-27. ScholarBank@NUS Repository. 15370755 http://scholarbank.nus.edu.sg/handle/10635/55334 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Electronic Device Failure Analysis
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Goh, S.H. Quah, A.C.T. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H.
format	Article
author	Goh, S.H. Quah, A.C.T. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H.
spellingShingle	Goh, S.H. Quah, A.C.T. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H. Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
author_sort	Goh, S.H.
title	Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
title_short	Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
title_full	Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
title_fullStr	Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
title_full_unstemmed	Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
title_sort	combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55334
_version_	1681084480035487744

Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis

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