Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis

Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis

Electronic Device Failure Analysis

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Bibliographic Details
Main Authors: Goh, S.H., Quah, A.C.T., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55334
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Institution: National University of Singapore

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