Diameter dependence of the void formation in the oxidation of nickel nanowires

10.1088/0957-4484/22/23/235606

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Bibliographic Details
Main Authors: Ren, Y., Chiam, S.Y., Chim, W.K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55630
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Institution: National University of Singapore