Diameter dependence of the void formation in the oxidation of nickel nanowires
10.1088/0957-4484/22/23/235606
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Main Authors: | Ren, Y., Chiam, S.Y., Chim, W.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55630 |
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Institution: | National University of Singapore |
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