Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples
10.1016/j.ultramic.2004.06.002
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sg-nus-scholar.10635-558542023-10-26T07:35:44Z Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples Wong, W.K. Rau, E.I. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING Capacitive-coupling EBIC Electron-acoustic SEAM SEBIV 10.1016/j.ultramic.2004.06.002 Ultramicroscopy 101 2-4 183-195 ULTRD 2014-06-17T02:47:52Z 2014-06-17T02:47:52Z 2004-11 Article Wong, W.K., Rau, E.I., Thong, J.T.L. (2004-11). Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples. Ultramicroscopy 101 (2-4) : 183-195. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ultramic.2004.06.002 03043991 http://scholarbank.nus.edu.sg/handle/10635/55854 000224046100014 Scopus |
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Capacitive-coupling EBIC Electron-acoustic SEAM SEBIV |
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Capacitive-coupling EBIC Electron-acoustic SEAM SEBIV Wong, W.K. Rau, E.I. Thong, J.T.L. Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
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10.1016/j.ultramic.2004.06.002 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Wong, W.K. Rau, E.I. Thong, J.T.L. |
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Article |
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Wong, W.K. Rau, E.I. Thong, J.T.L. |
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Wong, W.K. |
title |
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
title_short |
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
title_full |
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
title_fullStr |
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
title_full_unstemmed |
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
title_sort |
electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samples |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/55854 |
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1781412200072609792 |