Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility
10.1063/1.2976632
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55868 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-55868 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-558682023-10-25T23:29:49Z Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility Xie, R. Wu, N. Shen, C. Zhu, C. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2976632 Applied Physics Letters 93 8 - APPLA 2014-06-17T02:48:03Z 2014-06-17T02:48:03Z 2008 Article Xie, R., Wu, N., Shen, C., Zhu, C. (2008). Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility. Applied Physics Letters 93 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2976632 00036951 http://scholarbank.nus.edu.sg/handle/10635/55868 000259011900109 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.2976632 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Xie, R. Wu, N. Shen, C. Zhu, C. |
| format |
Article |
| author |
Xie, R. Wu, N. Shen, C. Zhu, C. |
| spellingShingle |
Xie, R. Wu, N. Shen, C. Zhu, C. Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| author_sort |
Xie, R. |
| title |
Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| title_short |
Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| title_full |
Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| title_fullStr |
Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| title_full_unstemmed |
Energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with HfO2 gate dielectric and its impact on mobility |
| title_sort |
energy distribution of interface traps in germanium metal-oxide- semiconductor field effect transistors with hfo2 gate dielectric and its impact on mobility |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/55868 |
| _version_ |
1781412201972629504 |