On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack
10.1063/1.2783967
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sg-nus-scholar.10635-568932023-10-26T07:18:15Z On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack Samanta, P. Zhu, C. Chan, M. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2783967 Applied Physics Letters 91 11 - APPLA 2014-06-17T02:59:52Z 2014-06-17T02:59:52Z 2007 Article Samanta, P., Zhu, C., Chan, M. (2007). On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack. Applied Physics Letters 91 (11) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2783967 00036951 http://scholarbank.nus.edu.sg/handle/10635/56893 000249474000107 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1063/1.2783967 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Samanta, P. Zhu, C. Chan, M. |
| format |
Article |
| author |
Samanta, P. Zhu, C. Chan, M. |
| spellingShingle |
Samanta, P. Zhu, C. Chan, M. On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| author_sort |
Samanta, P. |
| title |
On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| title_short |
On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| title_full |
On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| title_fullStr |
On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| title_full_unstemmed |
On the electrical stress-induced oxide-trapped charges in thin Hf O2 Si O2 gate dielectric stack |
| title_sort |
on the electrical stress-induced oxide-trapped charges in thin hf o2 si o2 gate dielectric stack |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/56893 |
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1781781301630599168 |