Self-heating-induced spatial spread of interface state generation by hot-electron effect: Role of the high-energy tail electron

Self-heating-induced spatial spread of interface state generation by hot-electron effect: Role of the high-energy tail electron

10.1109/LED.2008.2000966

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Bibliographic Details
Main Authors: Ang, D.S., Phua, T.W.H., Ling, C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Channel temperature
High-energy tail electrons
Hot-carrier effect
Strained-Si/SiGe heterostructure
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57368
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Institution: National University of Singapore
Description
Summary:10.1109/LED.2008.2000966

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