Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry
10.1016/j.optcom.2011.01.041
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sg-nus-scholar.10635-607512023-10-26T09:14:21Z Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. Gao, Z. MECHANICAL ENGINEERING Micro-profile measurement phase extraction White-light scanning interferometry (WLSI) windowed Fourier transform (WFT) 10.1016/j.optcom.2011.01.041 Optics Communications 284 10-11 2488-2493 OPCOB 2014-06-17T06:26:54Z 2014-06-17T06:26:54Z 2011-05-15 Article Ma, S., Quan, C., Zhu, R., Tay, C.J., Chen, L., Gao, Z. (2011-05-15). Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry. Optics Communications 284 (10-11) : 2488-2493. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2011.01.041 00304018 http://scholarbank.nus.edu.sg/handle/10635/60751 000289128600014 Scopus |
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Micro-profile measurement phase extraction White-light scanning interferometry (WLSI) windowed Fourier transform (WFT) |
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Micro-profile measurement phase extraction White-light scanning interferometry (WLSI) windowed Fourier transform (WFT) Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. Gao, Z. Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
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10.1016/j.optcom.2011.01.041 |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. Gao, Z. |
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Article |
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Ma, S. Quan, C. Zhu, R. Tay, C.J. Chen, L. Gao, Z. |
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Ma, S. |
title |
Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
title_short |
Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
title_full |
Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
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Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
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Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry |
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micro-profile measurement based on windowed fourier transform in white-light scanning interferometry |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/60751 |
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