A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress
Materials Research Society Symposium - Proceedings
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sg-nus-scholar.10635-617192015-01-15T22:37:23Z A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress Guan, H. Xu, Z. Cho, B.J. Li, M.F. He, Y.D. ELECTRICAL ENGINEERING Materials Research Society Symposium - Proceedings 592 105-110 MRSPD 2014-06-17T06:43:13Z 2014-06-17T06:43:13Z 2000 Article Guan, H.,Xu, Z.,Cho, B.J.,Li, M.F.,He, Y.D. (2000). A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress. Materials Research Society Symposium - Proceedings 592 : 105-110. ScholarBank@NUS Repository. 02729172 http://scholarbank.nus.edu.sg/handle/10635/61719 NOT_IN_WOS Scopus |
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Materials Research Society Symposium - Proceedings |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Guan, H. Xu, Z. Cho, B.J. Li, M.F. He, Y.D. |
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Article |
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Guan, H. Xu, Z. Cho, B.J. Li, M.F. He, Y.D. |
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Guan, H. Xu, Z. Cho, B.J. Li, M.F. He, Y.D. A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
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Guan, H. |
title |
A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
title_short |
A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
title_full |
A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
title_fullStr |
A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
title_full_unstemmed |
A study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
title_sort |
study of quasi-breakdown mechanism in ultrathin gate oxide under various types of stress |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/61719 |
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1681085644709822464 |