Characterization of leakage current in thin gate oxide subjected to 10 KeV X-ray irradiation
10.1109/16.824744
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Main Authors: | , , |
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Other Authors: | |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61931 |
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Institution: | National University of Singapore |
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