Conduction mechanism under quasibreakdown of ultrathin gate oxide
Applied Physics Letters
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2014
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sg-nus-scholar.10635-619592015-01-16T15:10:33Z Conduction mechanism under quasibreakdown of ultrathin gate oxide He, Y.D. Guan, H. Li, M.F. Cho, B.J. Dong, Z. ELECTRICAL ENGINEERING Applied Physics Letters 75 16 2432-2434 APPLA 2014-06-17T06:45:53Z 2014-06-17T06:45:53Z 1999-10-18 Article He, Y.D.,Guan, H.,Li, M.F.,Cho, B.J.,Dong, Z. (1999-10-18). Conduction mechanism under quasibreakdown of ultrathin gate oxide. Applied Physics Letters 75 (16) : 2432-2434. ScholarBank@NUS Repository. 00036951 http://scholarbank.nus.edu.sg/handle/10635/61959 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Applied Physics Letters |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING He, Y.D. Guan, H. Li, M.F. Cho, B.J. Dong, Z. |
| format |
Article |
| author |
He, Y.D. Guan, H. Li, M.F. Cho, B.J. Dong, Z. |
| spellingShingle |
He, Y.D. Guan, H. Li, M.F. Cho, B.J. Dong, Z. Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| author_sort |
He, Y.D. |
| title |
Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| title_short |
Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| title_full |
Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| title_fullStr |
Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| title_full_unstemmed |
Conduction mechanism under quasibreakdown of ultrathin gate oxide |
| title_sort |
conduction mechanism under quasibreakdown of ultrathin gate oxide |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/61959 |
| _version_ |
1681085688333729792 |