Conduction mechanism under quasibreakdown of ultrathin gate oxide
Applied Physics Letters
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Main Authors: | He, Y.D., Guan, H., Li, M.F., Cho, B.J., Dong, Z. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61959 |
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Institution: | National University of Singapore |
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