Electron-beam irradiation-induced gate oxide degradation

Journal of Applied Physics

Saved in:

Bibliographic Details
Main Authors:	Cho, B.J., Chong, P.F., Chor, E.F., Joo, M.S., Yeo, I.S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62130
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

Description
Summary:	Journal of Applied Physics

Similar Items