Electron-beam irradiation-induced gate oxide degradation
Journal of Applied Physics
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2014
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sg-nus-scholar.10635-621302015-03-18T11:54:24Z Electron-beam irradiation-induced gate oxide degradation Cho, B.J. Chong, P.F. Chor, E.F. Joo, M.S. Yeo, I.S. ELECTRICAL ENGINEERING Journal of Applied Physics 88 11 6731-6735 JAPIA 2014-06-17T06:47:43Z 2014-06-17T06:47:43Z 2000-12 Article Cho, B.J.,Chong, P.F.,Chor, E.F.,Joo, M.S.,Yeo, I.S. (2000-12). Electron-beam irradiation-induced gate oxide degradation. Journal of Applied Physics 88 (11) : 6731-6735. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/62130 NOT_IN_WOS Scopus |
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National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Journal of Applied Physics |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Cho, B.J. Chong, P.F. Chor, E.F. Joo, M.S. Yeo, I.S. |
| format |
Article |
| author |
Cho, B.J. Chong, P.F. Chor, E.F. Joo, M.S. Yeo, I.S. |
| spellingShingle |
Cho, B.J. Chong, P.F. Chor, E.F. Joo, M.S. Yeo, I.S. Electron-beam irradiation-induced gate oxide degradation |
| author_sort |
Cho, B.J. |
| title |
Electron-beam irradiation-induced gate oxide degradation |
| title_short |
Electron-beam irradiation-induced gate oxide degradation |
| title_full |
Electron-beam irradiation-induced gate oxide degradation |
| title_fullStr |
Electron-beam irradiation-induced gate oxide degradation |
| title_full_unstemmed |
Electron-beam irradiation-induced gate oxide degradation |
| title_sort |
electron-beam irradiation-induced gate oxide degradation |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62130 |
| _version_ |
1681085719572905984 |