Front- and backside investigations of thermal and electronic properties of semiconducting devices
Microelectronics Reliability
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62223 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-62223 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-622232015-02-26T11:01:29Z Front- and backside investigations of thermal and electronic properties of semiconducting devices Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. ELECTRICAL ENGINEERING Microelectronics Reliability 39 6-7 937-940 MCRLA 2014-06-17T06:48:44Z 2014-06-17T06:48:44Z 1999-06 Article Fiege, G.B.M.,Schade, W.,Palaniappan, M.,Ng, V.,Phang, J.C.H.,Balk, L.J. (1999-06). Front- and backside investigations of thermal and electronic properties of semiconducting devices. Microelectronics Reliability 39 (6-7) : 937-940. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/62223 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Microelectronics Reliability |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. |
| format |
Article |
| author |
Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. |
| spellingShingle |
Fiege, G.B.M. Schade, W. Palaniappan, M. Ng, V. Phang, J.C.H. Balk, L.J. Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| author_sort |
Fiege, G.B.M. |
| title |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_short |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_full |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_fullStr |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_full_unstemmed |
Front- and backside investigations of thermal and electronic properties of semiconducting devices |
| title_sort |
front- and backside investigations of thermal and electronic properties of semiconducting devices |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62223 |
| _version_ |
1681085736597585920 |