Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope

Scanning Microscopy

Saved in:

Bibliographic Details
Main Authors:	Pey, K.L., Phang, J.C.H., Chan, D.S.H., Balk, L.J., Jakubowicz, A., Bresse, J.F., Myhajlenko, S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Subjects:	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62355
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-62355
record_format	dspace
spelling	sg-nus-scholar.10635-623552015-01-09T08:48:54Z Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S. ELECTRICAL ENGINEERING INSTITUTE OF MICROELECTRONICS Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope Scanning Microscopy 7 4 1195-1206 SCMIE 2014-06-17T06:50:09Z 2014-06-17T06:50:09Z 1993-12 Article Pey, K.L.,Phang, J.C.H.,Chan, D.S.H.,Balk, L.J.,Jakubowicz, A.,Bresse, J.F.,Myhajlenko, S. (1993-12). Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope. Scanning Microscopy 7 (4) : 1195-1206. ScholarBank@NUS Repository. 08917035 http://scholarbank.nus.edu.sg/handle/10635/62355 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope
spellingShingle	Cathodoluminescence cathodoluminescence contrast dislocation GaAs preferential etching scanning electron microscope Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S. Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
description	Scanning Microscopy
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S.
format	Article
author	Pey, K.L. Phang, J.C.H. Chan, D.S.H. Balk, L.J. Jakubowicz, A. Bresse, J.F. Myhajlenko, S.
author_sort	Pey, K.L.
title	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_short	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_full	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_fullStr	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_full_unstemmed	Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope
title_sort	investigation of dislocations in gaas using cathodoluminescence in the scanning electron microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62355
_version_	1681085760621510656

Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscope

Similar Items