Modelling techniques for the quantification of some electron beam induced phenomena
Scanning Microscopy
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sg-nus-scholar.10635-624322015-01-28T05:16:37Z Modelling techniques for the quantification of some electron beam induced phenomena Chim, W.K. Chan, D.S.H. Low, T.S. Phang, J.C.H. Sim, K.S. Pey, K.L. Dinnis, A.R. Holt, D.B. Nakamae, K. Schottler, M. ELECTRICAL ENGINEERING Scanning Microscopy 6 4 961-978 SCMIE 2014-06-17T06:50:59Z 2014-06-17T06:50:59Z 1992-12 Article Chim, W.K.,Chan, D.S.H.,Low, T.S.,Phang, J.C.H.,Sim, K.S.,Pey, K.L.,Dinnis, A.R.,Holt, D.B.,Nakamae, K.,Schottler, M. (1992-12). Modelling techniques for the quantification of some electron beam induced phenomena. Scanning Microscopy 6 (4) : 961-978. ScholarBank@NUS Repository. 08917035 http://scholarbank.nus.edu.sg/handle/10635/62432 NOT_IN_WOS Scopus |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chim, W.K. Chan, D.S.H. Low, T.S. Phang, J.C.H. Sim, K.S. Pey, K.L. Dinnis, A.R. Holt, D.B. Nakamae, K. Schottler, M. |
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Chim, W.K. Chan, D.S.H. Low, T.S. Phang, J.C.H. Sim, K.S. Pey, K.L. Dinnis, A.R. Holt, D.B. Nakamae, K. Schottler, M. |
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Chim, W.K. Chan, D.S.H. Low, T.S. Phang, J.C.H. Sim, K.S. Pey, K.L. Dinnis, A.R. Holt, D.B. Nakamae, K. Schottler, M. Modelling techniques for the quantification of some electron beam induced phenomena |
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Chim, W.K. |
title |
Modelling techniques for the quantification of some electron beam induced phenomena |
title_short |
Modelling techniques for the quantification of some electron beam induced phenomena |
title_full |
Modelling techniques for the quantification of some electron beam induced phenomena |
title_fullStr |
Modelling techniques for the quantification of some electron beam induced phenomena |
title_full_unstemmed |
Modelling techniques for the quantification of some electron beam induced phenomena |
title_sort |
modelling techniques for the quantification of some electron beam induced phenomena |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/62432 |
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1681085774594834432 |