Modelling techniques for the quantification of some electron beam induced phenomena

Modelling techniques for the quantification of some electron beam induced phenomena

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Bibliographic Details
Main Authors:	Chim, W.K., Chan, D.S.H., Low, T.S., Phang, J.C.H., Sim, K.S., Pey, K.L., Dinnis, A.R., Holt, D.B., Nakamae, K., Schottler, M.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62432
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Institution:	National University of Singapore

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