Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs

10.1088/0268-1242/10/12/016

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Main Authors:	Ling, C.H., Samudra, G.S., Seah, B.P.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62772
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-62772
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spelling	sg-nus-scholar.10635-627722024-11-09T07:32:50Z Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs Ling, C.H. Samudra, G.S. Seah, B.P. ELECTRICAL ENGINEERING 10.1088/0268-1242/10/12/016 Semiconductor Science and Technology 10 12 1659-1666 2014-06-17T06:54:42Z 2014-06-17T06:54:42Z 1995-12 Article Ling, C.H., Samudra, G.S., Seah, B.P. (1995-12). Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs. Semiconductor Science and Technology 10 (12) : 1659-1666. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/10/12/016 02681242 http://scholarbank.nus.edu.sg/handle/10635/62772 A1995TJ50800016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0268-1242/10/12/016
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ling, C.H. Samudra, G.S. Seah, B.P.
format	Article
author	Ling, C.H. Samudra, G.S. Seah, B.P.
spellingShingle	Ling, C.H. Samudra, G.S. Seah, B.P. Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
author_sort	Ling, C.H.
title	Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
title_short	Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
title_full	Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
title_fullStr	Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
title_full_unstemmed	Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs
title_sort	simulation of logarithmic time dependence of hot carrier degradation in pmosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62772
_version_	1821214953405677568

Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs

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