Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Colloids and Surfaces A: Physicochemical and Engineering Aspects

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Bibliographic Details
Main Authors: Kwek, J.W., Vakarelski, I.U., Ng, W.K., Heng, J.Y.Y., Tan, R.B.H.
Other Authors: CHEMICAL & BIOMOLECULAR ENGINEERING
Format: Article
Published: 2014
Subjects:
Atomic force microscope
Electrostatic forces
Microparticles
Online Access:http://scholarbank.nus.edu.sg/handle/10635/64310
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Institution: National University of Singapore

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