Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling
10.1109/LED.2002.805750
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sg-nus-scholar.10635-679022024-11-10T17:48:04Z Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling Chen, G. Li, M.F. Ang, C.H. Zheng, J.Z. Kwong, D.L. ELECTRICAL ENGINEERING ELECTRICAL & COMPUTER ENGINEERING Annealing CMOSFETs Negative bias temperature instability (NBTI) Semiconductor-insulator interfaces Ultrathin gate oxide 10.1109/LED.2002.805750 IEEE Electron Device Letters 23 12 734-736 EDLED 2014-06-18T05:32:20Z 2014-06-18T05:32:20Z 2002-12 Others Chen, G., Li, M.F., Ang, C.H., Zheng, J.Z., Kwong, D.L. (2002-12). Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling. IEEE Electron Device Letters 23 (12) : 734-736. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2002.805750 07413106 http://scholarbank.nus.edu.sg/handle/10635/67902 000180954100016 Scopus |
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Annealing CMOSFETs Negative bias temperature instability (NBTI) Semiconductor-insulator interfaces Ultrathin gate oxide |
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Annealing CMOSFETs Negative bias temperature instability (NBTI) Semiconductor-insulator interfaces Ultrathin gate oxide Chen, G. Li, M.F. Ang, C.H. Zheng, J.Z. Kwong, D.L. Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
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10.1109/LED.2002.805750 |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Chen, G. Li, M.F. Ang, C.H. Zheng, J.Z. Kwong, D.L. |
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Chen, G. Li, M.F. Ang, C.H. Zheng, J.Z. Kwong, D.L. |
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Chen, G. |
title |
Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
title_short |
Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
title_full |
Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
title_fullStr |
Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
title_full_unstemmed |
Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling |
title_sort |
dynamic nbti of p-mos transistors and its impact on mosfet scaling |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/67902 |
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1821217607172227072 |