A review of laser induced techniques for microelectronic failure analysis

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors:	Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69040
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69040
record_format	dspace
spelling	sg-nus-scholar.10635-690402015-01-08T01:21:50Z A review of laser induced techniques for microelectronic failure analysis Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Chin, J.M. Davis, B. Bruce, M. Wilcox, J. Gilfeather, G. Chua, C.M. Koh, L.S. Ng, H.Y. Tan, S.H. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 255-261 2014-06-19T02:56:09Z 2014-06-19T02:56:09Z 2004 Conference Paper Phang, J.C.H.,Chan, D.S.H.,Palaniappan, M.,Chin, J.M.,Davis, B.,Bruce, M.,Wilcox, J.,Gilfeather, G.,Chua, C.M.,Koh, L.S.,Ng, H.Y.,Tan, S.H. (2004). A review of laser induced techniques for microelectronic failure analysis. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 255-261. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/69040 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Chin, J.M. Davis, B. Bruce, M. Wilcox, J. Gilfeather, G. Chua, C.M. Koh, L.S. Ng, H.Y. Tan, S.H.
format	Conference or Workshop Item
author	Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Chin, J.M. Davis, B. Bruce, M. Wilcox, J. Gilfeather, G. Chua, C.M. Koh, L.S. Ng, H.Y. Tan, S.H.
spellingShingle	Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Chin, J.M. Davis, B. Bruce, M. Wilcox, J. Gilfeather, G. Chua, C.M. Koh, L.S. Ng, H.Y. Tan, S.H. A review of laser induced techniques for microelectronic failure analysis
author_sort	Phang, J.C.H.
title	A review of laser induced techniques for microelectronic failure analysis
title_short	A review of laser induced techniques for microelectronic failure analysis
title_full	A review of laser induced techniques for microelectronic failure analysis
title_fullStr	A review of laser induced techniques for microelectronic failure analysis
title_full_unstemmed	A review of laser induced techniques for microelectronic failure analysis
title_sort	review of laser induced techniques for microelectronic failure analysis
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69040
_version_	1681086940945842176

A review of laser induced techniques for microelectronic failure analysis

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