A review of laser induced techniques for microelectronic failure analysis

• Main Authors: Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/69040
• Institution: National University of Singapore

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA