Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects
Annual Proceedings - Reliability Physics (Symposium)
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2014
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sg-nus-scholar.10635-693972015-02-20T12:18:11Z Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects Ngwan, V.C. Zhu, C. Krishnamoorthy, A. ELECTRICAL & COMPUTER ENGINEERING Interconnects LOW-k and Copper Annual Proceedings - Reliability Physics (Symposium) 571-572 ARLPB 2014-06-19T03:00:12Z 2014-06-19T03:00:12Z 2004 Conference Paper Ngwan, V.C.,Zhu, C.,Krishnamoorthy, A. (2004). Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects. Annual Proceedings - Reliability Physics (Symposium) : 571-572. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/69397 NOT_IN_WOS Scopus |
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Interconnects LOW-k and Copper |
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Interconnects LOW-k and Copper Ngwan, V.C. Zhu, C. Krishnamoorthy, A. Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
description |
Annual Proceedings - Reliability Physics (Symposium) |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING Ngwan, V.C. Zhu, C. Krishnamoorthy, A. |
format |
Conference or Workshop Item |
author |
Ngwan, V.C. Zhu, C. Krishnamoorthy, A. |
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Ngwan, V.C. |
title |
Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
title_short |
Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
title_full |
Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
title_fullStr |
Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
title_full_unstemmed |
Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnects |
title_sort |
analysis of leakage mechanisms and leakage pathways in intra-level cu interconnects |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/69397 |
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1681087006294147072 |