Analysis of premature breakdown in high-power devices using IBIC microscopy

2005 European Conference on Power Electronics and Applications

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Bibliographic Details
Main Authors:	Zmeck, M., Balk, L.J., Pugatschow, A., Niedernostheide, F.-J., Schulze, H.-J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Device characterization Measurement Power semiconductor device Reliability Simulation
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69400
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69400
record_format	dspace
spelling	sg-nus-scholar.10635-694002015-01-07T06:41:11Z Analysis of premature breakdown in high-power devices using IBIC microscopy Zmeck, M. Balk, L.J. Pugatschow, A. Niedernostheide, F.-J. Schulze, H.-J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. ELECTRICAL & COMPUTER ENGINEERING PHYSICS Device characterization Measurement Power semiconductor device Reliability Simulation 2005 European Conference on Power Electronics and Applications 2005 - 2014-06-19T03:00:14Z 2014-06-19T03:00:14Z 2005 Conference Paper Zmeck, M.,Balk, L.J.,Pugatschow, A.,Niedernostheide, F.-J.,Schulze, H.-J.,Osipowicz, T.,Watt, F.,Phang, J.C.H.,Khambadkone, A.M. (2005). Analysis of premature breakdown in high-power devices using IBIC microscopy. 2005 European Conference on Power Electronics and Applications 2005 : -. ScholarBank@NUS Repository. 9075815085 http://scholarbank.nus.edu.sg/handle/10635/69400 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Device characterization Measurement Power semiconductor device Reliability Simulation
spellingShingle	Device characterization Measurement Power semiconductor device Reliability Simulation Zmeck, M. Balk, L.J. Pugatschow, A. Niedernostheide, F.-J. Schulze, H.-J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Analysis of premature breakdown in high-power devices using IBIC microscopy
description	2005 European Conference on Power Electronics and Applications
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Zmeck, M. Balk, L.J. Pugatschow, A. Niedernostheide, F.-J. Schulze, H.-J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M.
format	Conference or Workshop Item
author	Zmeck, M. Balk, L.J. Pugatschow, A. Niedernostheide, F.-J. Schulze, H.-J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M.
author_sort	Zmeck, M.
title	Analysis of premature breakdown in high-power devices using IBIC microscopy
title_short	Analysis of premature breakdown in high-power devices using IBIC microscopy
title_full	Analysis of premature breakdown in high-power devices using IBIC microscopy
title_fullStr	Analysis of premature breakdown in high-power devices using IBIC microscopy
title_full_unstemmed	Analysis of premature breakdown in high-power devices using IBIC microscopy
title_sort	analysis of premature breakdown in high-power devices using ibic microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69400
_version_	1681087006860378112

Analysis of premature breakdown in high-power devices using IBIC microscopy

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