Analysis of premature breakdown in high-power devices using IBIC microscopy

• Main Authors: Zmeck, M., Balk, L.J., Pugatschow, A., Niedernostheide, F.-J., Schulze, H.-J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Device characterization; Measurement; Power semiconductor device; Reliability; Simulation
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/69400
• Institution: National University of Singapore

2005 European Conference on Power Electronics and Applications