Analysis of premature breakdown in high-power devices using IBIC microscopy

Analysis of premature breakdown in high-power devices using IBIC microscopy

2005 European Conference on Power Electronics and Applications

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Bibliographic Details
Main Authors: Zmeck, M., Balk, L.J., Pugatschow, A., Niedernostheide, F.-J., Schulze, H.-J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Device characterization
Measurement
Power semiconductor device
Reliability
Simulation
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69400
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Institution: National University of Singapore

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