Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
10.1016/j.phpro.2008.07.133
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sg-nus-scholar.10635-698472023-10-30T20:37:18Z Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) Khursheed, A. Yu, D. ELECTRICAL & COMPUTER ENGINEERING Chromatic aberration correction Electron optical simulation Time-of-flight electron emission microscope (TOFEEM) 10.1016/j.phpro.2008.07.133 Physics Procedia 1 1 513-519 2014-06-19T03:05:21Z 2014-06-19T03:05:21Z 2008-08 Conference Paper Khursheed, A., Yu, D. (2008-08). Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM). Physics Procedia 1 (1) : 513-519. ScholarBank@NUS Repository. https://doi.org/10.1016/j.phpro.2008.07.133 18753884 http://scholarbank.nus.edu.sg/handle/10635/69847 000275907500059 Scopus |
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Chromatic aberration correction Electron optical simulation Time-of-flight electron emission microscope (TOFEEM) |
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Chromatic aberration correction Electron optical simulation Time-of-flight electron emission microscope (TOFEEM) Khursheed, A. Yu, D. Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
description |
10.1016/j.phpro.2008.07.133 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Khursheed, A. Yu, D. |
format |
Conference or Workshop Item |
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Khursheed, A. Yu, D. |
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Khursheed, A. |
title |
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
title_short |
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
title_full |
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
title_fullStr |
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
title_full_unstemmed |
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) |
title_sort |
design of a chromatic aberration corrected time-of-flight electron emission microscope (tofeem) |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/69847 |
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