Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)

10.1016/j.phpro.2008.07.133

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Bibliographic Details
Main Authors: Khursheed, A., Yu, D.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69847
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-698472023-10-30T20:37:18Z Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM) Khursheed, A. Yu, D. ELECTRICAL & COMPUTER ENGINEERING Chromatic aberration correction Electron optical simulation Time-of-flight electron emission microscope (TOFEEM) 10.1016/j.phpro.2008.07.133 Physics Procedia 1 1 513-519 2014-06-19T03:05:21Z 2014-06-19T03:05:21Z 2008-08 Conference Paper Khursheed, A., Yu, D. (2008-08). Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM). Physics Procedia 1 (1) : 513-519. ScholarBank@NUS Repository. https://doi.org/10.1016/j.phpro.2008.07.133 18753884 http://scholarbank.nus.edu.sg/handle/10635/69847 000275907500059 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Chromatic aberration correction
Electron optical simulation
Time-of-flight electron emission microscope (TOFEEM)
spellingShingle Chromatic aberration correction
Electron optical simulation
Time-of-flight electron emission microscope (TOFEEM)
Khursheed, A.
Yu, D.
Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
description 10.1016/j.phpro.2008.07.133
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Khursheed, A.
Yu, D.
format Conference or Workshop Item
author Khursheed, A.
Yu, D.
author_sort Khursheed, A.
title Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
title_short Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
title_full Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
title_fullStr Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
title_full_unstemmed Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
title_sort design of a chromatic aberration corrected time-of-flight electron emission microscope (tofeem)
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/69847
_version_ 1781783120707584000