Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)

10.1016/j.phpro.2008.07.133

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Bibliographic Details
Main Authors: Khursheed, A., Yu, D.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69847
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Institution: National University of Singapore
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