Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
10.1016/j.phpro.2008.07.133
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Main Authors: | Khursheed, A., Yu, D. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69847 |
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Institution: | National University of Singapore |
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