Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS
10.1117/12.447100
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2014
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sg-nus-scholar.10635-700912023-10-27T08:50:27Z Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS Lim, H.F. Chua, S.J. Dong, J.R. Chi, D.Z. Soh, C.B. ELECTRICAL & COMPUTER ENGINEERING Capture barrier Extended defect InGaAlP Isothermal Logarithmic dependence 10.1117/12.447100 Proceedings of SPIE - The International Society for Optical Engineering 4598 125-132 PSISD 2014-06-19T03:08:07Z 2014-06-19T03:08:07Z 2001 Conference Paper Lim, H.F., Chua, S.J., Dong, J.R., Chi, D.Z., Soh, C.B. (2001). Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS. Proceedings of SPIE - The International Society for Optical Engineering 4598 : 125-132. ScholarBank@NUS Repository. https://doi.org/10.1117/12.447100 0277786X http://scholarbank.nus.edu.sg/handle/10635/70091 000174463800015 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| topic |
Capture barrier Extended defect InGaAlP Isothermal Logarithmic dependence |
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Capture barrier Extended defect InGaAlP Isothermal Logarithmic dependence Lim, H.F. Chua, S.J. Dong, J.R. Chi, D.Z. Soh, C.B. Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| description |
10.1117/12.447100 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Lim, H.F. Chua, S.J. Dong, J.R. Chi, D.Z. Soh, C.B. |
| format |
Conference or Workshop Item |
| author |
Lim, H.F. Chua, S.J. Dong, J.R. Chi, D.Z. Soh, C.B. |
| author_sort |
Lim, H.F. |
| title |
Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| title_short |
Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| title_full |
Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| title_fullStr |
Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| title_full_unstemmed |
Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS |
| title_sort |
effect of v/iii ratio on extended defects in ingaalp measured by isothermal dlts |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/70091 |
| _version_ |
1781783138279620608 |