Effect of V/III ratio on extended defects in InGaAlP measured by isothermal DLTS
10.1117/12.447100
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Main Authors: | Lim, H.F., Chua, S.J., Dong, J.R., Chi, D.Z., Soh, C.B. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70091 |
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Institution: | National University of Singapore |
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