Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contacts

Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contacts

10.1016/j.tsf.2005.09.063

Saved in:
Bibliographic Details
Main Authors: Jin, L.J., Pey, K.L., Choi, W.K., Antoniadis, D.A., Fitzgerald, E.A., Chi, D.Z.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
SBH inhomogeneity
Schottky barrier height (SBH)
Thermionic emission model
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70124
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1016/j.tsf.2005.09.063

Similar Items