Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contacts

• Main Authors: Jin, L.J., Pey, K.L., Choi, W.K., Antoniadis, D.A., Fitzgerald, E.A., Chi, D.Z.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: SBH inhomogeneity; Schottky barrier height (SBH); Thermionic emission model
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70124
• Institution: National University of Singapore

10.1016/j.tsf.2005.09.063